女明星裸体看个够(无遮挡),一本大道伊人AV久久综合,好大好硬好深好爽想要 叫床,男女无遮挡XX00动态图120秒

產品中心

PRODUCTS CENTER

當前位置:首頁產品中心PID產品便攜式現場PID測試儀PID Check便攜式現場PID測試儀

便攜式現場PID測試儀
產品簡介

便攜式現場PID測試儀(電位誘發衰減)測試儀,適用于不同類型和尺寸的晶體硅組件,無需拆裝,測試時間在8小時之內(測量時間將少于8小時)。PIDcheck是與德國Fraunhofer CSP Halle合作開發的。

產品型號:PID Check
更新時間:2024-09-12
廠商性質:代理商
訪問量:861
詳細介紹在線留言

便攜式現場PID測試儀的好處和特點


安裝后或采購光伏電站前的質量檢查

PIDcheck是能夠發現已安裝的光伏組件是否對PID敏感的工具。


功率和產量預測

如果PID已經發生,只有PIDcheck的測量結果可以提供未來產量的預測。


評估針對PID的對策

PIDcheck設備能夠模擬恢復設備(偏移箱、浮動控制器)的應用,因此有助于在其安裝前評估恢復效果。

用于現場PID恢復的可逆高壓極性

便攜式現場PID測試儀可測量的參數


分流電阻、功率損耗、電導率、泄漏電流、濕度和溫度

易于使用的便攜式設備

欲了解更多信息,請訪問www.pidcon。。com





●   原型:24個電池,在高壓下正向暗I-V曲線的測量

●   新功能:高壓可雙向施加應力和恢復 在活動模塊中成功演示

●   Fraunhofer CSP 于2015年*提交認證

●   2018年上市

●   用戶:評估員、操作員、服務專家、安裝人員、模塊制作人






* Patent pending ?Verfahren und Anordnung zur Prüfung eines Solarmoduls auf Anf?lligkeit für Potentialinduzierte Degradation", DE 10 2015 213 047 A1


參考文獻: cells  (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced  degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163

(2)V. Naumann, K. Ilse, M. Pander, J. Tr?ndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic

modules, AIP Conference Proceedings 2147, 090005 (2019).

(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects  at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).

(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells

as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.

(5)K. Sporleder, J. Bauer, S. Gro?er, S. Richter, A. H?hnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under  Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.

(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. P?blau, S. Gro?er, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible  PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.

(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential  Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.

. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells

as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.

(5)K. Sporleder, J. Bauer, S. Gro?er, S. Richter, A. H?hnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under  Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.

(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. P?blau, S. Gro?er, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible  PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.

(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential  Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.



在線留言

留言框

  • 產品:

  • 您的單位:

  • 您的姓名:

  • 聯系電話:

  • 常用郵箱:

  • 省份:

  • 詳細地址:

  • 補充說明:

  • 驗證碼:

    請輸入計算結果(填寫阿拉伯數字),如:三加四=7

掃一掃,關注公眾號

服務電話:

021-34685181 上海市松江區千帆路288弄G60科創云廊3號樓602室 wei.zhu@shuyunsh.com
Copyright © 2024束蘊儀器(上海)有限公司 All Rights Reserved  備案號:滬ICP備17028678號-2